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  • MC74AC574MG

MC74AC574MG

2V~6V 95MHz D-Type Flip Flop 8μA 74AC Series 20-SOIC (0.209, 5.30mm Width)


  • Manufacturer: Rochester Electronics, LLC
  • Origchip NO: 699-MC74AC574MG
  • Package: 20-SOIC (0.209, 5.30mm Width)
  • Datasheet: PDF
  • Stock: 133
  • Description: 2V~6V 95MHz D-Type Flip Flop 8μA 74AC Series 20-SOIC (0.209, 5.30mm Width)(Kg)

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Details

Tags

Parameters
Mounting Type Surface Mount
Package / Case 20-SOIC (0.209, 5.30mm Width)
Supplier Device Package SOEIAJ-20
Operating Temperature -40°C~85°C TA
Packaging Tube
Series 74AC
Part Status Obsolete
Moisture Sensitivity Level (MSL) 3 (168 Hours)
Type D-Type
Voltage - Supply 2V~6V
Function Standard
Output Type Tri-State, Non-Inverted
Number of Elements 1
Clock Frequency 95MHz
Current - Quiescent (Iq) 8μA
Current - Output High, Low 24mA 24mA
Number of Bits per Element 8
Max Propagation Delay @ V, Max CL 9.5ns @ 5V, 50pF
Trigger Type Positive Edge
Input Capacitance 4.5pF
RoHS Status ROHS3 Compliant

MC74AC574MG Overview


It is packaged in the way of 20-SOIC (0.209, 5.30mm Width). You can find it in the Tubepackage. T flip flop uses Tri-State, Non-Invertedas the output. This trigger is configured to use Positive Edge. Surface Mountis occupied by this electronic component. A supply voltage of 2V~6V is required for operation. It is operating at a temperature of -40°C~85°C TA. There is D-Type type of electronic flip flop associated with this device. In terms of FPGAs, it belongs to the 74AC series. A frequency of 95MHzshould not be exceeded by its output. In total, it contains 1 elements. During its operation, it consumes 8μA quiescent energy. Its input capacitance is 4.5pFfarads.

MC74AC574MG Features


Tube package
74AC series

MC74AC574MG Applications


There are a lot of Rochester Electronics, LLC MC74AC574MG Flip Flops applications.

  • Differential Individual
  • Dynamic threshold performance
  • Control circuits
  • Clock pulse
  • EMI reduction circuitry
  • Load Control
  • Reduced system switching noise
  • Communications
  • High Performance Logic for test systems
  • Data transfer