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SY10EP31VZI

-3.3V~-5V 3GHz D-Type Flip Flop 10EP31 45mA 10EP Series 8-SOIC (0.154, 3.90mm Width)


  • Manufacturer: Microchip Technology
  • Origchip NO: 536-SY10EP31VZI
  • Package: 8-SOIC (0.154, 3.90mm Width)
  • Datasheet: PDF
  • Stock: 454
  • Description: -3.3V~-5V 3GHz D-Type Flip Flop 10EP31 45mA 10EP Series 8-SOIC (0.154, 3.90mm Width)(Kg)

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FedEx International, 5-7 business days.

The following are some common countries' logistic time.
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Details

Tags

Parameters
Mounting Type Surface Mount
Package / Case 8-SOIC (0.154, 3.90mm Width)
Supplier Device Package 8-SOIC
Operating Temperature -40°C~85°C TA
Packaging Tube
Published 2005
Series 10EP
Part Status Discontinued
Moisture Sensitivity Level (MSL) 1 (Unlimited)
Type D-Type
Voltage - Supply -3.3V~-5V
Base Part Number 10EP31
Function Set(Preset) and Reset
Output Type Differential
Number of Elements 1
Clock Frequency 3GHz
Current - Quiescent (Iq) 45mA
Number of Bits per Element 1
Trigger Type Positive Edge
RoHS Status Non-RoHS Compliant

SY10EP31VZI Overview


It is packaged in the way of 8-SOIC (0.154, 3.90mm Width). You can find it in the Tubepackage. In the configuration, Differentialis used as the output. JK flip flop uses Positive Edgeas the trigger. In this case, the electronic component is mounted in the way of Surface Mount. The JK flip flop operates at -3.3V~-5Vvolts. It is operating at -40°C~85°C TA. It is an electronic flip flop with the type D-Type. In this case, it is a type of FPGA belonging to the 10EP series. Its output frequency should not exceed 3GHz. A total of 1elements are contained within it. There is 45mA quiescent consumption. This D latch belongs to the family of 10EP31.

SY10EP31VZI Features


Tube package
10EP series

SY10EP31VZI Applications


There are a lot of Microchip Technology SY10EP31VZI Flip Flops applications.

  • Individual Asynchronous Resets
  • Power down protection
  • Balanced Propagation Delays
  • ESCC
  • Clock pulse
  • Patented noise
  • Data storage
  • Divide a clock signal by 2 or 4
  • High Performance Logic for test systems
  • Parallel data storage