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74ABT273CSJX

4.5V~5.5V 200MHz D-Type Flip Flop 74ABT273 50μA 74ABT Series 20-SOIC (0.209, 5.30mm Width)


  • Manufacturer: ON Semiconductor
  • Origchip NO: 598-74ABT273CSJX
  • Package: 20-SOIC (0.209, 5.30mm Width)
  • Datasheet: PDF
  • Stock: 764
  • Description: 4.5V~5.5V 200MHz D-Type Flip Flop 74ABT273 50μA 74ABT Series 20-SOIC (0.209, 5.30mm Width)(Kg)

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Details

Tags

Parameters
Mounting Type Surface Mount
Package / Case 20-SOIC (0.209, 5.30mm Width)
Supplier Device Package 20-SOP
Operating Temperature -40°C~85°C TA
Packaging Tape & Reel (TR)
Series 74ABT
Part Status Obsolete
Moisture Sensitivity Level (MSL) 1 (Unlimited)
Type D-Type
Voltage - Supply 4.5V~5.5V
Base Part Number 74ABT273
Function Master Reset
Output Type Non-Inverted
Number of Elements 1
Clock Frequency 200MHz
Current - Quiescent (Iq) 50μA
Current - Output High, Low 32mA 64mA
Number of Bits per Element 8
Max Propagation Delay @ V, Max CL 6.8ns @ 5V, 50pF
Trigger Type Positive Edge
Input Capacitance 5pF

74ABT273CSJX Overview


As a result, it is packaged as 20-SOIC (0.209, 5.30mm Width). D flip flop is embedded in the Tape & Reel (TR) package. Non-Invertedis the output configured for it. The trigger configured with it uses Positive Edge. There is an electronic component mounted in the way of Surface Mount. With a supply voltage of 4.5V~5.5V volts, it operates. -40°C~85°C TAis the operating temperature. The type of this D latch is D-Type. In FPGA terms, D flip flop is a type of 74ABTseries FPGA. This D flip flop should not have a frequency greater than 200MHz. A total of 1elements are contained within it. It consumes 50μA of quiescent The object belongs to the 74ABT273 family. There is 5pF input capacitance for this T flip flop.

74ABT273CSJX Features


Tape & Reel (TR) package
74ABT series

74ABT273CSJX Applications


There are a lot of ON Semiconductor 74ABT273CSJX Flip Flops applications.

  • Matched Rise and Fall
  • Registers
  • ESD performance
  • Patented noise
  • Memory
  • Differential Individual
  • Communications
  • Digital electronics systems
  • High Performance Logic for test systems
  • Frequency division