74F377SC

74F377SC Overview

It is packaged in the way of 20-SOIC (0.295, 7.50mm Width). You can find it in the Tubepackage. T flip flop uses Non-Invertedas its output configuration. There is a trigger configured with Positive Edge. Surface Mountis occupied by this electronic component. A voltage of 4.5V~5.5Vis used as the supply voltage. A temperature of 0°C~70°C TAis considered to be the operating temperature. It belongs to the type D-Typeof flip flops. It is a type of FPGA belonging to the 74F series. In order for it to function properly, its output frequency should not exceed 130MHz. There are 1 elements in it. It consumes 48mA of quiescent D latch belongs to the 74F377 family. In this case, the electronic component is mounted in the way of Surface Mount. With its 20pins, it is designed to work with most electronic flip flops. This device's clock edge trigger type is Positive Edge. This flip flop is designed with 8 Bits. The superior flexibility of this product is achieved by using 1 circuits. For high efficiency, the supply voltage should be set to 5V. There are 3 output Lines, which generate the binary equivalent of the input line whose value is equal to “1” and are available to encode either a decimal or hexadecimal input pattern to typically a binary or “B. C. D” (binary coded decimal) output code. This input has 8lines. -1mAis the output current at high level. There is no low level output current set at 20mA. Ideally, the operating temperature should be below 70°C. It is recommended that the operating temperature be greater than 0°C. It operates with the minimal supply voltage of 4.5V. It supports the maximal supply voltage of 5.5V. The frequency can be set to 130MHz.

74F377SC Features

Tube package
74F series
20 pins
8 Bits

74F377SC Applications

There are a lot of ON Semiconductor 74F377SC Flip Flops applications.

• Latch-up performance
• Event Detectors
• QML qualified product
• EMI reduction circuitry
• Divide a clock signal by 2 or 4
• Automotive
• Set-reset capability
• ESD protection
• High Performance Logic for test systems
• Data transfer