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74VCX16374MTD

1.2V~3.6V 250MHz D-Type Flip Flop 20μA 74VCX Series 48-TFSOP (0.240, 6.10mm Width)


  • Manufacturer: Rochester Electronics, LLC
  • Origchip NO: 699-74VCX16374MTD
  • Package: 48-TFSOP (0.240, 6.10mm Width)
  • Datasheet: PDF
  • Stock: 217
  • Description: 1.2V~3.6V 250MHz D-Type Flip Flop 20μA 74VCX Series 48-TFSOP (0.240, 6.10mm Width)(Kg)

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Details

Tags

Parameters
Mounting Type Surface Mount
Package / Case 48-TFSOP (0.240, 6.10mm Width)
Supplier Device Package 48-TSSOP
Operating Temperature -40°C~85°C TA
Packaging Tube
Series 74VCX
Part Status Obsolete
Moisture Sensitivity Level (MSL) 2 (1 Year)
Type D-Type
Voltage - Supply 1.2V~3.6V
Function Standard
Output Type Tri-State, Non-Inverted
Number of Elements 2
Clock Frequency 250MHz
Current - Quiescent (Iq) 20μA
Current - Output High, Low 24mA 24mA
Number of Bits per Element 8
Max Propagation Delay @ V, Max CL 3ns @ 3.3V, 30pF
Trigger Type Positive Edge
Input Capacitance 6pF
RoHS Status ROHS3 Compliant

74VCX16374MTD Overview


The flip flop is packaged in 48-TFSOP (0.240, 6.10mm Width). You can find it in the Tubepackage. T flip flop uses Tri-State, Non-Invertedas its output configuration. The trigger it is configured with uses Positive Edge. Surface Mountis occupied by this electronic component. The JK flip flop operates at a voltage of 1.2V~3.6V. -40°C~85°C TAis the operating temperature. There is D-Type type of electronic flip flop associated with this device. FPGAs belonging to the 74VCXseries contain this type of chip. It should not exceed 250MHzin terms of its output frequency. The element count is 2 . As a result, it consumes 20μA quiescent current and is not affected by external forces. There is 6pF input capacitance for this T flip flop.

74VCX16374MTD Features


Tube package
74VCX series

74VCX16374MTD Applications


There are a lot of Rochester Electronics, LLC 74VCX16374MTD Flip Flops applications.

  • Computers
  • Dynamic threshold performance
  • Computing
  • Load Control
  • Power down protection
  • Communications
  • High Performance Logic for test systems
  • Bounce elimination switch
  • Control circuits
  • Parallel data storage